Invention Grant
- Patent Title: Inspection device
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Application No.: US17785920Application Date: 2020-12-01
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Publication No.: US11940482B2Publication Date: 2024-03-26
- Inventor: Takashi Isa
- Applicant: NIDEC READ CORPORATION
- Applicant Address: JP Kyoto
- Assignee: NIDEC READ CORPORATION
- Current Assignee: NIDEC READ CORPORATION
- Current Assignee Address: JP Kyoto
- Agency: Viering, Jentschura & Partner mbB
- Priority: JP 19230178 2019.12.20
- International Application: PCT/JP2020/044609 2020.12.01
- International Announcement: WO2021/124862A 2021.06.24
- Date entered country: 2022-06-16
- Main IPC: G01R31/28
- IPC: G01R31/28

Abstract:
An upper mechanism including a table provided with a placement surface of an inspection target, a lower mechanism configured to rotatably support the upper mechanism, and a lifting operation unit configured to be supported by the upper mechanism so as to be movable up and down are provided. The lower mechanism includes a rotation drive unit configured to rotate the upper mechanism, and a push-up force output unit configured to lift and lower the lifting operation unit. A transmission member with which a tip of the push-up force output unit can contact or separate is provided at a lower end of the lifting operation unit.
Public/Granted literature
- US20230024921A1 INSPECTION DEVICE Public/Granted day:2023-01-26
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