Invention Grant
- Patent Title: Apparatus and method for checking an error of a non-volatile memory device in a memory system
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Application No.: US17204036Application Date: 2021-03-17
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Publication No.: US11941289B2Publication Date: 2024-03-26
- Inventor: Jung Ae Kim , Jee Yul Kim
- Applicant: SK hynix Inc.
- Applicant Address: KR Gyeonggi-do
- Assignee: SK hynix Inc.
- Current Assignee: SK hynix Inc.
- Current Assignee Address: KR Gyeonggi-do
- Agency: IP & T GROUP LLP
- Priority: KR 20200132607 2020.10.14
- Main IPC: G06F3/06
- IPC: G06F3/06 ; G06F12/0882

Abstract:
A memory system includes a memory device including plural memory groups, each memory group including plural non-volatile memory cells; and a controller configured to transmit a command to the memory device so that the memory device performs a data input/output operation within at least one memory group among the plural memory groups, receive a response for the command and a status data regarding the at least one memory group from the memory device, and determine whether the data input/output operation has succeeded or failed based on the response and the status data.
Public/Granted literature
- US20220113908A1 APPARATUS AND METHOD FOR CHECKING AN ERROR OF A NON-VOLATILE MEMORY DEVICE IN A MEMORY SYSTEM Public/Granted day:2022-04-14
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