Invention Grant
- Patent Title: Evaluation system, evaluation device, evaluation method, evaluation program, and recording medium
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Application No.: US16968680Application Date: 2018-10-04
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Publication No.: US11941796B2Publication Date: 2024-03-26
- Inventor: Yoshinari Nakano
- Applicant: SINTOKOGIO, LTD.
- Applicant Address: JP Nagoya
- Assignee: SINTOKOGIO, LTD.
- Current Assignee: SINTOKOGIO, LTD.
- Current Assignee Address: JP Nagoya
- Agency: Faegre Drinker Biddle & Reath LLP
- Priority: JP 18026097 2018.02.16
- International Application: PCT/JP2018/037250 2018.10.04
- International Announcement: WO2019/159424A 2019.08.22
- Date entered country: 2020-08-10
- Main IPC: G06T7/00
- IPC: G06T7/00 ; G06N3/08 ; G06T5/00 ; G06T7/90

Abstract:
An evaluation system is a system configured to evaluate coverage of an evaluation target by using a captured image of the evaluation target. The evaluation system includes: an image acquisition unit configured to acquire the captured image; a correction unit configured to generate an evaluation image by correcting the captured image; an evaluation unit configured to evaluate the coverage based on the evaluation image; and an output unit configured to output a result of the evaluation carried out by the evaluation unit, wherein the correction unit extracts an evaluation region from the captured image based on the size of a dent region included in the captured image and generates the evaluation image based on the evaluation region, and the dent region is an image of a dent formed on the evaluation target.
Public/Granted literature
- US20210004947A1 EVALUATION SYSTEM, EVALUATION DEVICE, EVALUATION METHOD, EVALUATION PROGRAM, AND RECORDING MEDIUM Public/Granted day:2021-01-07
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