Invention Grant
- Patent Title: Gas analyzer apparatus
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Application No.: US18065656Application Date: 2022-12-14
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Publication No.: US11942312B2Publication Date: 2024-03-26
- Inventor: Naoki Takahashi , Prakash Sreedhar Murthy
- Applicant: ATONARP INC.
- Applicant Address: JP Tokyo
- Assignee: ATONARP INC.
- Current Assignee: ATONARP INC.
- Current Assignee Address: JP Tokyo
- Agency: BUCHANAN INGERSOLL & ROONEY PC
- Priority: JP 19057148 2019.03.25
- Main IPC: H01J37/32
- IPC: H01J37/32 ; H01J49/10

Abstract:
There is provided a gas analyzer apparatus including: a sample chamber which is equipped with a dielectric wall structure and into which only sample gas to be measured is introduced; a plasma generation mechanism that generates plasma inside the sample chamber, which has been depressurized, using an electric field and/or a magnetic field applied through the dielectric wall structure; and an analyzer unit that analyzes the sample gas via the generated plasma. By doing so, it is possible to provide a gas analyzer apparatus capable of accurately analyzing sample gases, even those including corrosive gas, over a long period of time.
Public/Granted literature
- US20230187190A1 GAS ANALYZER APPARATUS Public/Granted day:2023-06-15
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