Invention Grant
- Patent Title: Parameter adjustment device, parameter adjustment method, and program
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Application No.: US17272974Application Date: 2019-03-15
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Publication No.: US11945113B2Publication Date: 2024-04-02
- Inventor: Yuki Nishina
- Applicant: OMRON Corporation
- Applicant Address: JP Kyoto
- Assignee: OMRON Corporation
- Current Assignee: OMRON Corporation
- Current Assignee Address: JP Kyoto
- Agency: ROSSI, KIMMS & McDOWELL LLP
- International Application: PCT/JP2019/010916 2019.03.15
- International Announcement: WO2020/188646A 2020.09.24
- Date entered country: 2021-03-03
- Main IPC: B25J9/16
- IPC: B25J9/16 ; G05B19/18 ; G05B19/401

Abstract:
Three-dimensional measurement data is obtained (step S1). The poses of bulk parts are calculated (step S2). The gripping poses of a hand relative to the bulk parts are calculated (step S3). Individual evaluation indices are calculated (step S4). Overall evaluation indices are calculated (step S5). The gripping poses are sorted using the overall evaluation indices (step S6). The calculated gripping poses appear on a screen (step S7). The gripping poses are sorted by a user in an intended order (step S8). Determination is performed as to whether the difference between the results of the sorting in step S6 and in step S8 is small (step S9). In response to the difference being sufficiently small, parameters used in the calculation of the overall evaluation indices are stored (step S11). In response to the difference not being sufficiently small, the parameters are updated (step S10) and the processing returns to step S5.
Public/Granted literature
- US20210402594A1 PARAMETER ADJUSTMENT DEVICE, PARAMETER ADJUSTMENT METHOD, AND PROGRAM Public/Granted day:2021-12-30
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