Invention Grant
- Patent Title: Systems and methods for measuring a temperature of a gas
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Application No.: US17085856Application Date: 2020-10-30
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Publication No.: US11946871B2Publication Date: 2024-04-02
- Inventor: Alexey Shashurin , Xingxing Wang
- Applicant: Purdue Research Foundation
- Applicant Address: US IN West Lafayette
- Assignee: Purdue Research Foundation
- Current Assignee: Purdue Research Foundation
- Current Assignee Address: US IN West Lafayette
- Agency: Hartman Global IP Law
- Agent Gary M. Hartman; Domenica N. S. Hartman
- Main IPC: G01N21/67
- IPC: G01N21/67 ; G01N21/17
Abstract:
Methods and systems capable of measuring gas temperatures utilizing plasma discharges. Such a method performs a measurement of a temperature of a gas by generating a probing nanosecond plasma pulse in the gas, and then using an optical emission spectroscopy technique to measure the temperature of the gas by processing a light emission signal excited by the probing nanosecond plasma pulse.
Public/Granted literature
- US20210199590A1 SYSTEMS AND METHODS FOR MEASURING A TEMPERATURE OF A GAS Public/Granted day:2021-07-01
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