Invention Grant
- Patent Title: Process environment for inorganic resist patterning
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Application No.: US17188679Application Date: 2021-03-01
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Publication No.: US11947262B2Publication Date: 2024-04-02
- Inventor: Alan J. Telecky , Jason K. Stowers , Douglas A. Keszler , Stephen T. Meyers , Peter de Schepper , Sonia Castellanos Ortega , Michael Greer , Kirsten Louthan
- Applicant: Inpria Corporation
- Applicant Address: US OR Corvallis
- Assignee: Inpria Corporation
- Current Assignee: Inpria Corporation
- Current Assignee Address: US OR Corvallis
- Agency: Christensen, Fonder, Dardi PLLC
- Agent Diane E. Bennett; Peter S. Dardi
- Main IPC: G03F7/38
- IPC: G03F7/38 ; G03F7/004

Abstract:
The processing of radiation patternable organometallic coatings is shown to be improved through the appropriate selection of post processing conditions between coating and development of the pattern. In particular, a coated wafer can be subjected to process delays to allow aging of the coating at various process points, in particular following irradiation. Process delays can be combined and interspersed with heating steps. The atmosphere above the coated wafer at various process steps can be adjusted to obtain desired improvements in the development of the pattern. Reactive gases can be beneficial with respect to improvement of coating properties.
Public/Granted literature
- US20210271170A1 PROCESS ENVIRONMENT FOR INORGANIC RESIST PATTERNING Public/Granted day:2021-09-02
Information query
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