Invention Grant
- Patent Title: Systems and methods for classifying PUF signature modules of integrated circuits
-
Application No.: US17883670Application Date: 2022-08-09
-
Publication No.: US11947713B2Publication Date: 2024-04-02
- Inventor: Cheng-En Lee , Shih-Lien Linus Lu
- Applicant: Taiwan Semiconductor Manufacturing Company Limited
- Applicant Address: TW Hsinchu
- Assignee: Taiwan Semiconductor Manufacturing Company Limited
- Current Assignee: Taiwan Semiconductor Manufacturing Company Limited
- Current Assignee Address: TW Hsinchu
- Agency: Jones Day
- The original application number of the division: US16785877 2020.02.10
- Main IPC: G06F21/73
- IPC: G06F21/73 ; H04L9/32
Abstract:
Systems and method are provided for determining a reliability of a physically unclonable function (PUF) cell of a device. One or more activation signals are provided to a PUF cell under a plurality of conditions. A PUF cell output provided by the PUF cell under each of the plurality of conditions is determined. A determination is made of a number of times the PUF cell output of the PUF cell is consistent. And a device classification value is determined based on the determined number of times for a plurality of PUF cells.
Public/Granted literature
- US20220382913A1 Systems and Methods for Classifying PUF Signature Modules of Integrated Circuits Public/Granted day:2022-12-01
Information query
