Invention Grant
- Patent Title: Automatically measuring quality scores for connected components using machine learning models
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Application No.: US17525758Application Date: 2021-11-12
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Publication No.: US11948164B2Publication Date: 2024-04-02
- Inventor: Mridul Jain , Saigopal Thota , Ashraful Arefeen , Antriksh Akshesh Shah , Albin Kuruvilla , Gajendra Alias Nishad Kamat , Rijul Magu , Neil Mohan Reddy Palleti
- Applicant: Walmart Apollo, LLC
- Applicant Address: US AR Bentonville
- Assignee: WALMART APOLLO, LLC
- Current Assignee: WALMART APOLLO, LLC
- Current Assignee Address: US AR Bentonville
- Agency: BRYAN CAVE LEIGHTON PAISNER LLP
- Main IPC: G06Q30/02
- IPC: G06Q30/02 ; G06Q30/0204 ; G06Q30/0241 ; G06Q30/0242
Abstract:
A system including one or more processors and one or more non-transitory computer-readable media storing computing instructions configured to run on the one or more processors and perform: generating linkage scores between nodes at least based on a machine learning model; creating links between the nodes to form connected components based on the linkage scores exceeding a predetermined threshold; generating an actual matching linkage set of the nodes linked in the connected components by using a relaxed blocking criteria; and generating a quality score for the connected components. Other embodiments are disclosed.
Public/Granted literature
- US20230153848A1 AUTOMATICALLY MEASURING QUALITY SCORES FOR CONNECTED COMPONENTS USING MACHINE LEARNING MODELS Public/Granted day:2023-05-18
Information query
