Invention Grant
- Patent Title: Interconnection structure with anti-adhesion layer
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Application No.: US17230701Application Date: 2021-04-14
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Publication No.: US11948835B2Publication Date: 2024-04-02
- Inventor: Che-Cheng Chang , Chih-Han Lin
- Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Applicant Address: TW Hsinchu
- Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Current Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Current Assignee Address: TW Hsinchu
- Agency: Maschoff Brennan
- The original application number of the division: US14984568 2015.12.30
- Main IPC: H01L21/768
- IPC: H01L21/768 ; H01L23/485 ; H01L23/528

Abstract:
A device comprises a first metal structure, a dielectric structure, a dielectric residue, and a second metal structure. The dielectric structure is over the first metal structure. The dielectric structure has a stepped sidewall structure. The stepped sidewall structure comprises a lower sidewall and an upper sidewall laterally set back from the lower sidewall. The dielectric residue is embedded in a recessed region in the lower sidewall of the stepped sidewall structure of the dielectric structure. The second metal structure extends through the dielectric structure to the first metal structure.
Public/Granted literature
- US20210233806A1 INTERCONNECTION STRUCTURE WITH ANTI-ADHESION LAYER Public/Granted day:2021-07-29
Information query
IPC分类: