Invention Grant
- Patent Title: Manufacturing method of semiconductor device
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Application No.: US17990749Application Date: 2022-11-21
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Publication No.: US11948990B2Publication Date: 2024-04-02
- Inventor: Po-Yu Yang
- Applicant: UNITED MICROELECTRONICS CORP.
- Applicant Address: TW Hsin-Chu
- Assignee: UNITED MICROELECTRONICS CORP.
- Current Assignee: UNITED MICROELECTRONICS CORP.
- Current Assignee Address: TW Hsin-Chu
- Agent Winston Hsu
- Priority: CN 2110030120.6 2021.01.11
- Main IPC: H01L29/423
- IPC: H01L29/423 ; H01L27/092 ; H01L29/786

Abstract:
A manufacturing method of a semiconductor device includes the following steps. A first transistor is formed on a substrate. The first transistor includes a first semiconductor channel structure and two first source/drain structures. The first semiconductor channel structure includes first horizontal portions and a first vertical portion. The first horizontal portions are stacked in a vertical direction and separated from one another. Each of the first horizontal portions is elongated in a horizontal direction. The first vertical portion is elongated in the vertical direction and connected with the first horizontal portions. The two first source/drain structures are disposed at two opposite sides of each of the first horizontal portions in the horizontal direction respectively. The two first source/drain structures are connected with the first horizontal portions.
Public/Granted literature
- US20230079155A1 MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE Public/Granted day:2023-03-16
Information query
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