Invention Grant
- Patent Title: Semiconductor structure and method for forming the same
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Application No.: US17137587Application Date: 2020-12-30
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Publication No.: US11949008B2Publication Date: 2024-04-02
- Inventor: Chang-Hwang Hua , Chia-Hao Chen
- Applicant: WIN SEMICONDUCTORS CORP.
- Applicant Address: TW Taoyuan
- Assignee: WIN SEMICONDUCTORS CORP.
- Current Assignee: WIN SEMICONDUCTORS CORP.
- Current Assignee Address: TW Taoyuan
- Agency: McClure, Qualey & Rodack, LLP
- Main IPC: H01L29/778
- IPC: H01L29/778 ; H01L29/16 ; H01L29/20 ; H01L29/66

Abstract:
A semiconductor structure is provided. The semiconductor structure includes a substrate having a front side and a back side opposite the front side. The semiconductor structure also includes a first contact metal layer disposed on the front side of the substrate. The semiconductor structure further includes a III-V compound semiconductor layer disposed between the substrate and the first contact metal layer. Moreover, the semiconductor structure includes a via hole penetrating through the substrate and the III-V compound semiconductor layer from the back side of the substrate. The bottom of the via hole is defined by the first contact metal layer, and the first contact metal layer includes molybdenum, tungsten, iridium, palladium, platinum, cobalt, ruthenium, osmium, rhodium, rhenium, or a combination thereof.
Public/Granted literature
- US20220208999A1 SEMICONDUCTOR STRUCTURE AND METHOD FOR FORMING THE SAME Public/Granted day:2022-06-30
Information query
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