Invention Grant
- Patent Title: Selective symbol measurement for positioning
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Application No.: US17467659Application Date: 2021-09-07
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Publication No.: US11950210B2Publication Date: 2024-04-02
- Inventor: Alexandros Manolakos , Mukesh Kumar , Srinivas Yerramalli
- Applicant: QUALCOMM Incorporated
- Applicant Address: US CA San Diego
- Assignee: QUALCOMM Incorporated
- Current Assignee: QUALCOMM Incorporated
- Current Assignee Address: US CA San Diego
- Agency: QUALCOMM Incorporated
- Main IPC: H04W72/02
- IPC: H04W72/02 ; H04L5/00 ; H04W52/02 ; H04W72/04 ; H04W72/08 ; H04W72/51 ; H04W72/542

Abstract:
A method of measuring a wireless OFDM PRS at a user equipment includes: selecting a symbol subset of a symbol group of the OFDM PRS, the OFDM PRS comprising a slot of symbols comprising the symbol group, the symbol group consisting of a first symbol quantity of consecutive ones of the symbols, the symbol group being fully staggered in frequency domain, the symbol subset consisting of a second symbol quantity of the symbols of the symbol group, the second symbol quantity being smaller than the first symbol quantity, and the symbol subset being less than fully staggered in the frequency domain; and measuring the symbol subset without measuring all of the symbols of the symbol group.
Public/Granted literature
- US20220078759A1 SELECTIVE SYMBOL MEASUREMENT FOR POSITIONING Public/Granted day:2022-03-10
Information query