Invention Grant
- Patent Title: Characterization device for characterizing the quality of light beams reflected from a surface of a reflective element and method therefor
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Application No.: US17262330Application Date: 2019-07-25
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Publication No.: US11953236B2Publication Date: 2024-04-09
- Inventor: Iñigo Les Aguerrea , Amaia Mutuberria Larrayoz , Adrian Peña Lapuente , Marcelino Sanchez Gonzalez , Carlos Heras Vila , Iñigo Salina Áriz , David Izquierdo Núñez , Javier Garcia-Barberena Labiano
- Applicant: FUNDACIÓN CENER-CIEMAT
- Applicant Address: ES Sarriguren
- Assignee: FUNDACIÓN CENER-CIEMAT
- Current Assignee: FUNDACIÓN CENER-CIEMAT
- Current Assignee Address: ES Sarriguren
- Agency: Sughrue Mion, PLLC
- Priority: ES 1830756 2018.07.25
- International Application: PCT/ES2019/070524 2019.07.25
- International Announcement: WO2020/021147A 2020.01.30
- Date entered country: 2021-01-22
- Main IPC: G01B9/00
- IPC: G01B9/00 ; F24S20/20 ; F24S23/30 ; F24S50/20 ; F24S50/80 ; G01J1/04

Abstract:
A characterization device, system, and method for characterizing reflective elements from the light beams reflected in it. The device has two variable-gain detectors on a common structure, which can be portable or fixed, and for capturing light beams reflected by a reflective element, and from at least one processor characterizing the quality of the reflected light beams and evaluating the quality of the reflective element from its reflective capacity. Each detector has a lens for increasing the signal-to-noise ratio of the reflected beam or beams, a light sensor on which the beam or beams captured by the lens are focused, an automatic gain selection system associated with the optical sensor, and a data communication device associated with the device itself. A characterization system and a characterization method for characterizing reflective elements from the quality of the light beams reflected in at least one reflective element or heliostat.
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