Invention Grant
- Patent Title: Item inspection by dynamic selection of projection angle
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Application No.: US17251996Application Date: 2019-07-01
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Publication No.: US11953451B2Publication Date: 2024-04-09
- Inventor: Jan De Beenhouwer , Jan Sijbers
- Applicant: UNIVERSITEIT ANTWERPEN , IMEC VZW
- Applicant Address: BE Antwerp
- Assignee: UNIVERSITEIT ANTWERPEN,IMEC VZW
- Current Assignee: UNIVERSITEIT ANTWERPEN,IMEC VZW
- Current Assignee Address: BE Antwerp; BE Leuven
- Agency: Amster, Rothstein & Ebenstein LLP
- Priority: EP 180893 2018.06.29 EP 166687 2019.04.02
- International Application: PCT/EP2019/067584 2019.07.01
- International Announcement: WO2020/002704A 2020.01.02
- Date entered country: 2020-12-14
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G01N23/04 ; G06N20/00 ; G06T7/00

Abstract:
A method is provided for inspection of an item comprising acquiring a projection image of the item using a radiation imaging system and obtaining a plurality of simulated projection images of the item or a component thereof, based on a simulation of a numerical three-dimensional model. A relative orientation of the item with respect to the imaging system is determined by comparing the projection image to the plurality of simulated images, and at least one angle of rotation is determined by taking into account a viewing angle and the relative orientation. The method further comprises moving the item and/or the imaging system in accordance with the at least one angle of rotation and acquiring a further projection image of the item.
Public/Granted literature
- US20210270755A1 ITEM INSPECTION BY DYNAMIC SELECTION OF PROJECTION ANGLE Public/Granted day:2021-09-02
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