Invention Grant
- Patent Title: Deflection-type refractometer with extended measurement range
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Application No.: US17251570Application Date: 2018-11-19
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Publication No.: US11953476B2Publication Date: 2024-04-09
- Inventor: Alberto Ortin Sebastian , Benjamin Monrabal Bas
- Applicant: POLYMER CHARACTERIZATION, S.A.
- Applicant Address: ES Valencia
- Assignee: POLYMER CHARACTERIZATION, S.A.
- Current Assignee: POLYMER CHARACTERIZATION, S.A.
- Current Assignee Address: ES Valencia
- Agency: Lucas & Mercanti, LLP
- Priority: ES 1831017 2018.10.18
- International Application: PCT/EP2018/081676 2018.11.19
- International Announcement: WO2020/078574A 2020.04.23
- Date entered country: 2020-12-11
- Main IPC: G01N30/74
- IPC: G01N30/74 ; G01N21/41 ; G01N21/85 ; G01N30/02 ; G01N30/16

Abstract:
A deflection-type refractometer with extended measurement range having a light source generating a beam of light; a measuring cell with a sample chamber receiving a sample liquid; an optical sensor mounted on a movable platform for detecting the deflected beam of light; a driving unit configured to move the platform; a distance measurement unit for monitoring the displacement of the platform; a control unit configured to calculate the deflection of the beam of light based on the displacement of the platform and an output signal of the optical sensor to obtain a refractive index measure of the sample liquid using the calculated deflection.
Public/Granted literature
- US20210262994A1 DEFLECTION-TYPE REFRACTOMETER WITH EXTENDED MEASUREMENT RANGE Public/Granted day:2021-08-26
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