Invention Grant
- Patent Title: Abnormality diagnosis device, abnormality diagnosis method, and abnormality diagnosis system
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Application No.: US16644168Application Date: 2017-10-24
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Publication No.: US11953555B2Publication Date: 2024-04-09
- Inventor: Makoto Kanemaru , Takuya Ohkubo , Sota Sano , Akira Satake , Satoru Terashima
- Applicant: Mitsubishi Electric Corporation
- Applicant Address: JP Tokyo
- Assignee: MITSUBISHI ELECTRIC CORPORATION
- Current Assignee: MITSUBISHI ELECTRIC CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: XSENSUS LLP
- International Application: PCT/JP2017/038379 2017.10.24
- International Announcement: WO2019/082277A 2019.05.02
- Date entered country: 2020-03-04
- Main IPC: G01R31/34
- IPC: G01R31/34 ; H02H7/08 ; H02P29/024

Abstract:
An abnormality diagnosis device includes: a data acquirer to acquire a current waveform and a driving frequency of an electric motor; a storage which stores a combination of a current value of the current waveform and the driving frequency at an identical time by the data acquirer; a data determiner to determine whether or not a current value of the current waveform and the driving frequency as a diagnosis target at an identical time by the data acquisition match the combination stored in the storage; an analyzer to perform frequency analysis for the current waveform determined to be matched by the data determiner, to extract sideband waves, and calculate a spectrum intensity of the sideband waves; and an abnormality diagnosis processor to make a diagnosis that abnormality has occurred, when the spectrum intensity of the sideband waves is equal to or greater than a threshold.
Public/Granted literature
- US20200217895A1 ABNORMALITY DIAGNOSIS DEVICE, ABNORMALITY DIAGNOSIS METHOD, AND ABNORMALITY DIAGNOSIS SYSTEM Public/Granted day:2020-07-09
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