Invention Grant
- Patent Title: Inspection apparatus and control method of inspection apparatus
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Application No.: US18343663Application Date: 2023-06-28
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Publication No.: US11954382B2Publication Date: 2024-04-09
- Inventor: Daisuke Shibata
- Applicant: CANON KABUSHIKI KAISHA
- Applicant Address: JP Tokyo
- Assignee: Canon Kabushiki Kaisha
- Current Assignee: Canon Kabushiki Kaisha
- Current Assignee Address: JP Tokyo
- Agency: Canon U.S.A., Inc. IP Division
- Priority: JP 22105514 2022.06.30 JP 23080511 2023.05.16
- Main IPC: G06F3/12
- IPC: G06F3/12 ; G06T7/00
Abstract:
On the basis of determination by image inspection that an image defect is generated and a predetermined condition being satisfied, an instruction unit for issuing an image diagnosis instruction is displayed on a screen of an inspection result, and image diagnosis is executed in response to an operation on the instruction unit.
Public/Granted literature
- US20240004596A1 INSPECTION APPARATUS AND CONTROL METHOD OF INSPECTION APPARATUS Public/Granted day:2024-01-04
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