Invention Grant
- Patent Title: On-chip capacitors in semiconductor devices and methods for forming the same
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Application No.: US17488287Application Date: 2021-09-28
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Publication No.: US11955422B2Publication Date: 2024-04-09
- Inventor: Lei Xue , Wei Liu , Liang Chen
- Applicant: YANGTZE MEMORY TECHNOLOGIES CO., LTD.
- Applicant Address: CN Wuhan
- Assignee: YANGTZE MEMORY TECHNOLOGIES CO., LTD.
- Current Assignee: YANGTZE MEMORY TECHNOLOGIES CO., LTD.
- Current Assignee Address: CN Wuhan
- Agency: BAYES PLLC
- Priority: WO TCN2020112959 2020.09.02 WO TCN2020112962 2020.09.02
- The original application number of the division: US17147409 2021.01.12
- Main IPC: H01L23/522
- IPC: H01L23/522 ; H01L21/768 ; H01L49/02 ; H10B43/27 ; H10B43/35

Abstract:
Embodiments of semiconductor devices and methods for forming the same are disclosed. In an example, a semiconductor device includes at least one dielectric layer pair including a first dielectric layer and a second dielectric layer different from the first dielectric layer, an interlayer dielectric (ILD) layer in contact with the at least one dielectric layer pair, and one or more capacitors each extending vertically through the ILD layer and in contact with the at least one dielectric layer pair.
Public/Granted literature
- US20220068797A1 ON-CHIP CAPACITORS IN SEMICONDUCTOR DEVICES AND METHODS FOR FORMING THE SAME Public/Granted day:2022-03-03
Information query
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