Invention Grant
- Patent Title: Device and method for acquiring deviation amount of working position of tool
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Application No.: US16906082Application Date: 2020-06-19
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Publication No.: US11964396B2Publication Date: 2024-04-23
- Inventor: Takafumi Kajiyama , Hiroshi Nakagawa
- Applicant: Fanuc Corporation
- Applicant Address: JP Yamanashi
- Assignee: Fanuc Corporation
- Current Assignee: Fanuc Corporation
- Current Assignee Address: JP Yamanashi
- Agency: Buchanan Ingersoll & Rooney PC
- Priority: JP 19120255 2019.06.27
- Main IPC: B25J9/16
- IPC: B25J9/16

Abstract:
A device capable of acquiring a deviation of a working position of a tool with respect to a target position of a workpiece with higher accuracy in accordance with actual work. A device for acquiring a deviation amount of a working position of a tool with respect to a target position when a work is performed on a workpiece with respect to the target position by the tool, the tool being moved by a movement machine, the device including: a camera arranged in a predetermined positional relationship with respect to the tool and configured to image the target position at a first time point when the tool performs an operation for the work; and a deviation amount acquisition section configured to acquire a deviation amount between the working position and the target position at the first time point, based on a position of the target position in image data imaged by the camera and information indicating a position of the working position in the image data.
Information query
IPC分类: