Invention Grant
- Patent Title: Landmark detection using machine learning techniques
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Application No.: US17557984Application Date: 2021-12-21
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Publication No.: US11967136B2Publication Date: 2024-04-23
- Inventor: Shanhui Sun , Yikang Liu , Xiao Chen , Zhang Chen , Terrence Chen
- Applicant: Shanghai United Imaging Intelligence Co., Ltd.
- Applicant Address: CN Shanghai
- Assignee: Shanghai United Imaging Intelligence Co., Ltd.
- Current Assignee: Shanghai United Imaging Intelligence Co., Ltd.
- Current Assignee Address: CN Shanghai
- Agency: Zhong Law LLC
- Main IPC: G06V10/774
- IPC: G06V10/774 ; G06T7/00 ; G06V10/82

Abstract:
Described herein are systems, methods, and instrumentalities associated with landmark detection. The detection may be accomplished by determining a graph representation of a plurality of hypothetical landmarks detected in one or more medical images. The graph representation may include nodes that represent the hypothetical landmarks and edges that represent the relationships between paired hypothetical landmarks. The graph representation may be processed using a graph neural network such a message passing graph neural network, by which the landmark detection problem may be converted and solved as a graph node labeling problem.
Public/Granted literature
- US20230196742A1 LANDMARK DETECTION USING MACHINE LEARNING TECHNIQUES Public/Granted day:2023-06-22
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