Invention Grant
- Patent Title: Method of depositing thin film and method of manufacturing semiconductor device using the same
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Application No.: US17360982Application Date: 2021-06-28
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Publication No.: US11967503B2Publication Date: 2024-04-23
- Inventor: Su In Kim , Young Chul Choi , Chang Hak Shin , Min Woo Park , Ji Hyun Kim , Kyung Mi Kim
- Applicant: WONIK IPS CO., LTD.
- Applicant Address: KR Pyeongtaek-si
- Assignee: WONIK IPS CO., LTD.
- Current Assignee: WONIK IPS CO., LTD.
- Current Assignee Address: KR Pyeongtaek-si
- Agency: WILLIAM PARK & ASSOCIATES LTD.
- Priority: KR 20200091046 2020.07.22
- Main IPC: H01L21/02
- IPC: H01L21/02 ; H01J37/32

Abstract:
Provided are a method of depositing a thin film and a method of manufacturing a semiconductor device using the same, and the method of depositing a thin film uses a substrate processing apparatus including a chamber, a substrate support on which a substrate is mounted, a gas supply unit, and a power supply unit that supplies high-frequency and low-frequency power to the chamber, and includes: a step of mounting, on the substrate support, the substrate including a lower thin film deposited under the condition of a process temperature in a low temperature range; a step of depositing an upper thin film on the lower thin film under the condition of the process temperature in the low temperature range; and a step of treating a surface of the upper thin film under the condition of the process temperature in the low temperature range.
Public/Granted literature
- US20220028687A1 METHOD OF DEPOSITING THIN FILM AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE USING THE SAME Public/Granted day:2022-01-27
Information query
IPC分类: