Invention Grant
- Patent Title: Learning device, inspection device, learning method, and inspection method
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Application No.: US17053107Application Date: 2019-05-13
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Publication No.: US11977033B2Publication Date: 2024-05-07
- Inventor: Yuya Sugasawa , Hideyuki Arai , Hisashi Aikawa
- Applicant: Panasonic Intellectual Property Management Co., Ltd.
- Applicant Address: JP Osaka
- Assignee: PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Current Assignee: PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Current Assignee Address: JP Osaka
- Agency: Rimon P.C.
- Priority: JP 18105352 2018.05.31
- International Application: PCT/JP2019/018946 2019.05.13
- International Announcement: WO2019/230356A 2019.12.05
- Date entered country: 2020-11-05
- Main IPC: G01N21/00
- IPC: G01N21/00 ; G01N21/88 ; G06N3/08 ; G06N20/00 ; G06T7/00 ; G06V10/143 ; G06V10/764 ; G06V10/774 ; G06V20/00

Abstract:
A learning device includes a camera configured to acquire image data by imaging a sample of a product, a physical property information acquisition unit configured to acquire physical property information of the sample, and a processing unit configured to generate a learning model. The processing unit is configured to identify a category of the sample based on rule information relating the physical property information to the category, to generate teacher data by relating the identified category to the image data, and to generate a learning model by machine learning using the teacher data. The learning model outputs the category of the sample in response to an input of the image data of the sample.
Public/Granted literature
- US20210233232A1 LEARNING DEVICE, INSPECTION DEVICE, LEARNING METHOD, AND INSPECTION METHOD Public/Granted day:2021-07-29
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