Invention Grant
- Patent Title: Methods, circuits and systems for obtaining impedance or dielectric measurements of a material under test
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Application No.: US18110014Application Date: 2023-02-15
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Publication No.: US11977040B2Publication Date: 2024-05-07
- Inventor: Adam D. Blot , Manfred Geier , Andrew J. Westcott
- Applicant: TransTech Systems, Inc.
- Applicant Address: US NY Latham
- Assignee: TRANSTECH SYSTEMS, INC.
- Current Assignee: TRANSTECH SYSTEMS, INC.
- Current Assignee Address: US NY Latham
- Agency: Hoffman Warnick LLC
- Main IPC: G01N27/02
- IPC: G01N27/02

Abstract:
Certain disclosed methods include: transmitting an excitation signal into the MUT and transmitting a reference signal to a set of magnitude and phase (M/P) detectors; receiving the response signal; separately comparing a magnitude and phase for each of the excitation signal and the reference signal with corresponding detection ranges for a first one of the M/P detectors; separately comparing a magnitude and phase for each of the response signal and the reference signal with corresponding detection ranges for a second one of the M/P detectors; iteratively adjusting the excitation signal until the response signal has both a magnitude and a phase within the corresponding detection ranges for the second M/P detector; and iteratively adjusting the reference signal until the reference signal has both a magnitude and a phase within the corresponding detection ranges for the first and the second M/P detectors.
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