Invention Grant
- Patent Title: Multiple circuit board tester
-
Application No.: US18351104Application Date: 2023-07-12
-
Publication No.: US11977112B2Publication Date: 2024-05-07
- Inventor: Laura Thiel , Carlos Cid , Michael Tran , Giancarlo Urzi
- Applicant: LAT Enterprises Inc.
- Applicant Address: US NC Raleigh
- Assignee: LAT Enterprises Inc.
- Current Assignee: LAT Enterprises Inc.
- Current Assignee Address: US NC Raleigh
- Agency: NEO IP
- Main IPC: G01R31/28
- IPC: G01R31/28 ; H05K1/02
Abstract:
The present invention is directed to a system for testing printed circuit boards. The system is configured to test the simultaneously test a multiplicity of printed circuit boards. The system examines the electrical characteristics of a printed circuit board and is operable to identify if a printed circuit board meets a desired characteristic.
Public/Granted literature
- US20230349966A1 MULTIPLE CIRCUIT BOARD TESTER Public/Granted day:2023-11-02
Information query
