Invention Grant
- Patent Title: Abnormality diagnosis method, abnormality diagnosis device and non-transitory computer readable storage medium
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Application No.: US17620746Application Date: 2020-04-28
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Publication No.: US11977373B2Publication Date: 2024-05-07
- Inventor: Misa Nozuki , Shinsuke Miki
- Applicant: Mitsubishi Electric Corporation
- Applicant Address: JP Tokyo
- Assignee: MITSUBISHI ELECTRIC CORPORATION
- Current Assignee: MITSUBISHI ELECTRIC CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: XSENSUS LLP
- Priority: WO TJP2019030206 2019.08.01
- International Application: PCT/JP2020/018135 2020.04.28
- International Announcement: WO2021/019857A 2021.02.04
- Date entered country: 2021-12-20
- Main IPC: G05B23/02
- IPC: G05B23/02 ; G06F18/22

Abstract:
An abnormality diagnosis method for diagnosing an abnormality in operational state of a diagnosis subject includes creating a unit space from normal operation data of the diagnosis subject, the unit space serving as a reference for determining the operational state of the diagnosis subject, acquiring data having state quantities of a plurality of evaluation items from the diagnosis subject, calculating a Mahalanobis distance of the data acquired, using the unit space created, and determining an abnormality in the operational state of the diagnosis subject based on the Mahalanobis distance calculated. The creating a unit space includes creating a plurality of unit spaces having mutually different data lengths The calculating a Mahalanobis distance includes calculating a plurality of Mahalanobis distances using the plurality of unit spaces created. The determining an abnormality includes determining an abnormality based on the plurality of Mahalanobis distances calculated.
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