Invention Grant
- Patent Title: Determination of faulty state of storage device
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Application No.: US16330301Application Date: 2016-09-05
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Publication No.: US11977434B2Publication Date: 2024-05-07
- Inventor: Yantao Wang , Jing Liu , Lijun Shen
- Applicant: Telefonaktiebolaget LM Ericsson (publ)
- Applicant Address: SE Stockholm
- Assignee: Telefonaktiebolaget LM Ericsson (publ)
- Current Assignee: Telefonaktiebolaget LM Ericsson (publ)
- Current Assignee Address: SE Stockholm
- Agency: Sage Patent Group
- International Application: PCT/CN2016/098142 2016.09.05
- International Announcement: WO2018/040115A 2018.03.08
- Date entered country: 2019-03-04
- Main IPC: G06F11/00
- IPC: G06F11/00 ; G06F11/07 ; G06F11/30

Abstract:
Disclosed are a method and electronic device for determining a faulty state of a storage device. A first time length of a first access to a set of blocks of a storage device is determined. Then, the first time length of the access and a threshold time length are compared. If the first time length exceeds the threshold time length, it is determined that the blocks are in a potential faulty state.
Public/Granted literature
- US20190205198A1 DETERMINATION OF FAULTY STATE OF STORAGE DEVICE Public/Granted day:2019-07-04
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