A processing system includes a plurality of circuits configured to generate a plurality of error signals. The processing system further includes a plurality of error pads and a fault collection circuit configured to receive the plurality of error signals and to generate a respective combined error signal for each of the plurality of error pads. The fault collection circuit includes a combinational logic circuit configured to generate the combined error signal by selectively routing the plurality of error signals to the plurality of error pads as a function of a set of configuring bits.