Invention Grant
- Patent Title: Error rate measuring apparatus and error rate measuring method
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Application No.: US17656502Application Date: 2022-03-25
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Publication No.: US11977464B2Publication Date: 2024-05-07
- Inventor: Ryo Sunayama
- Applicant: ANRITSU CORPORATION
- Applicant Address: JP Kanagawa
- Assignee: ANRITSU CORPORATION
- Current Assignee: ANRITSU CORPORATION
- Current Assignee Address: JP Kanagawa
- Agency: Pearne & Gordon LLP
- Priority: JP 21096656 2021.06.09
- Main IPC: G06F11/263
- IPC: G06F11/263 ; G06F11/07 ; G06F11/273 ; G06F11/30

Abstract:
An error rate measuring apparatus detects a bit error of input data returned from a device under test with transmission of a test signal at an error detector, and includes a log recording unit that records log data of state transition of each lane by handshakes of a plurality of lanes in a predetermined communication standard with respect to the device under test in making the device under test transit to a state of LOOPBACK, and a display unit that displays the recorded log data of the state transition of each lane in a time-series order.
Public/Granted literature
- US20220398177A1 ERROR RATE MEASURING APPARATUS AND ERROR RATE MEASURING METHOD Public/Granted day:2022-12-15
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