Invention Grant
- Patent Title: Input sampling method, input sampling circuit and semiconductor memory
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Application No.: US17651421Application Date: 2022-02-16
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Publication No.: US11978502B2Publication Date: 2024-05-07
- Inventor: Zequn Huang
- Applicant: CHANGXIN MEMORY TECHNOLOGIES, INC.
- Applicant Address: CN Hefei
- Assignee: CHANGXIN MEMORY TECHNOLOGIES, INC.
- Current Assignee: CHANGXIN MEMORY TECHNOLOGIES, INC.
- Current Assignee Address: CN Hefei
- Agency: Syncoda LLC
- Agent Feng Ma
- Priority: CN 2110766193.1 2021.07.07
- Main IPC: G11C11/408
- IPC: G11C11/408 ; G11C11/4076 ; H03K19/20
Abstract:
An input sampling method includes the following operations. A first pulse signal and a second pulse signal are received. Logical operation is performed on the first pulse signal and the second pulse signal to determine a to-be-sampled signal. The to-be-sampled signal is obtained by shielding an invalid part of the second pulse signal according to a logical operation result. Sampling process is performed on the to-be-sampled signal to obtain a target sampled signal.
Public/Granted literature
- US20230010338A1 INPUT SAMPLING METHOD, INPUT SAMPLING CIRCUIT AND SEMICONDUCTOR MEMORY Public/Granted day:2023-01-12
Information query
IPC分类:
