- Patent Title: Apparatuses, systems, and methods for memory initiated calibration
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Application No.: US17890568Application Date: 2022-08-18
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Publication No.: US11979147B2Publication Date: 2024-05-07
- Inventor: Sujeet Ayyapureddi
- Applicant: MICRON TECHNOLOGY, INC.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Dorsey & Whitney LLP
- Main IPC: H03K19/00
- IPC: H03K19/00 ; H03K19/08 ; H03K19/17736

Abstract:
Apparatuses, systems, and methods for memory initiated calibration. The memory includes a termination circuit with a tunable resistor and a calibration detection circuit with a replica tunable resistor. The calibration detection circuit measures a resistance of the replica tunable resistor and provides a calibration request signal if the resistance is outside a tolerance. Responsive to the calibration request signal, a controller of the memory schedules the memory for a calibration operation.
Public/Granted literature
- US20240063794A1 APPARATUSES, SYSTEMS, AND METHODS FOR MEMORY INITIATED CALIBRATION Public/Granted day:2024-02-22
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