Invention Grant
- Patent Title: Error rate measuring apparatus and error count display method
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Application No.: US17514325Application Date: 2021-10-29
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Publication No.: US11979229B2Publication Date: 2024-05-07
- Inventor: Hiroyuki Onuma
- Applicant: ANRITSU CORPORATION
- Applicant Address: JP Kanagawa
- Assignee: ANRITSU CORPORATION
- Current Assignee: ANRITSU CORPORATION
- Current Assignee Address: JP Kanagawa
- Agency: Pearne & Gordon LLP
- Priority: JP 20215420 2020.12.24
- Main IPC: H04L1/00
- IPC: H04L1/00 ; G06F3/0482 ; G06F3/04847 ; H04L27/02

Abstract:
An error rate measuring apparatus includes error counting means for comparing bit string data obtained by converting a signal received from the device under test with error data, counting the number of FEC symbol errors by each codeword length in a case where the number of FEC symbol errors is less than the threshold value, and collectively counting the number of FEC symbol errors of codeword lengths in a case where the number of FEC symbol errors is equal to or greater than the threshold value, and display control means for displaying and controlling a list of collected results of the number of FEC symbol errors of each codeword length.
Public/Granted literature
- US20220209887A1 ERROR RATE MEASURING APPARATUS AND ERROR COUNT DISPLAY METHOD Public/Granted day:2022-06-30
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