Invention Grant
- Patent Title: System and method of extracting or inspecting a feature of an object using thermal imaging, and a method of inspecting an object of a garment product
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Application No.: US17566776Application Date: 2021-12-31
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Publication No.: US11979646B2Publication Date: 2024-05-07
- Inventor: Kin Sun Chan , Yan Nei Law , Zi Qiao Lam
- Applicant: Logistics and Supply Chain MultiTech R&D Centre Limited
- Applicant Address: HK Pok Fu Lam
- Assignee: Logistics and Supply Chain MultiTech R&D Centre Limited
- Current Assignee: Logistics and Supply Chain MultiTech R&D Centre Limited
- Current Assignee Address: HK Pok Fu Lam
- Agency: Renner, Kenner, Greive, Bobak, Taylor & Weber
- Main IPC: H04N23/11
- IPC: H04N23/11 ; G06V10/25 ; G06V10/771 ; H01J61/52

Abstract:
A system and method of extracting or inspecting a feature of an object using thermal imaging, and a method of inspecting an object of a garment product. The system includes a source of thermal influence arranged to heat or cool an object; an imager arranged to capture a plurality of images of the object when the object is subjected to the thermal influence; and an image processor arrange to processing the plurality of images and to distinguish a feature of interest from the other portions of the object presented on the plurality of images.
Public/Granted literature
Information query