Invention Grant
- Patent Title: Alignment means of measurement instrument
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Application No.: US17166396Application Date: 2019-09-04
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Publication No.: US11980422B2Publication Date: 2024-05-14
- Inventor: Mika Salkola , Antti Jaatinen , Kati Stranius , Mertsi Haapalainen
- Applicant: ICARE FINLAND OY
- Applicant Address: FI Vantaa
- Assignee: ICARE FINLAND OY
- Current Assignee: ICARE FINLAND OY
- Current Assignee Address: FI Vantaa
- Agency: Ziegler IP Law Group
- Priority: FI 185754 2018.09.11
- International Application: PCT/FI2019/050627 2019.09.04
- International Announcement: WO2020/053476A 2020.03.19
- Date entered country: 2021-02-03
- Main IPC: A61B3/16
- IPC: A61B3/16 ; A61B3/00 ; A61B3/15 ; G02B6/42

Abstract:
An alignment means of a measurement instrument includes a housing an optical component having a principal axis in a direction parallel to a desired alignment; a first light source positioned at a first distance S1 from the optical component and at a first height h1 from the principle axis; a second light source positioned at a second distance S2 from the optical component and at a second height h2 from the principle axis; and an angle barrier means arranged between the optical component, and the first and second light sources. The housing, the optical component, and the angle barrier means are arranged to block visibility of the first light source along the principal axis at a distance superior to d1′; and block visibility of the second light source along the principal axis at a distance smaller than d2, wherein d2 is smaller than d1′.
Public/Granted literature
- US20210298598A1 ALIGNMENT MEANS OF MEASUREMENT INSTRUMENT Public/Granted day:2021-09-30
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