Invention Grant
- Patent Title: Systems and methods to detect and measure the current mismatch among parallel semiconductor devices
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Application No.: US16598457Application Date: 2019-10-10
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Publication No.: US11982693B2Publication Date: 2024-05-14
- Inventor: Babak Parkhideh , Andreas Lauer
- Applicant: University of North Carolina Charlotte
- Applicant Address: US NC Charlotte
- Assignee: The University of North Carolina at Charlotte
- Current Assignee: The University of North Carolina at Charlotte
- Current Assignee Address: US NC Charlotte
- Agency: Loza & Loza, LLP
- Agent Michael I. Angert
- Main IPC: G01R15/20
- IPC: G01R15/20 ; H05K1/18

Abstract:
Apparatuses and methods of the present disclosure integrate a non-intrusive current sensor in the form of a current mismatch sensor into a power module having paralleled semiconductor structures or components. The current mismatch can be detected by the current sensor by monitoring a magnetic flux density between the paralleled components or devices.
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