• Patent Title: Method for calibrating a phased array
  • Application No.: US17354604
    Application Date: 2021-06-22
  • Publication No.: US11982761B2
    Publication Date: 2024-05-14
  • Inventor: Lance M. Bradstreet
  • Applicant: SRC, Inc.
  • Applicant Address: US NY North Syracuse
  • Assignee: SRC, Inc.
  • Current Assignee: SRC, Inc.
  • Current Assignee Address: US NY North Syracuse
  • Agent Jonathan L. Gray
  • Main IPC: G01S7/40
  • IPC: G01S7/40 G01S13/66 H01Q3/26
Method for calibrating a phased array
Abstract:
A method for calibrating a phased array including an antenna array comprising a plurality of antenna elements, comprising the steps: measuring with a probe a first antenna element pattern of a first antenna element of the plurality of antenna elements; performing a spherical near-field to far-field transformation of the first antenna element pattern; transforming the far-field first antenna element pattern to a plane-wave spectrum; back transforming the plane-wave far-field first antenna element pattern to a reference point within the near-field of the antenna array; normalizing the first antenna element pattern according to, at least, the value at the phase center of the plane-wave near-field first antenna element pattern; and calibrating the first antenna element based, at least in the part, on the normalized first antenna element pattern.
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