Invention Grant
- Patent Title: Logic based read sample offset in a memory sub-system
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Application No.: US17445395Application Date: 2021-08-18
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Publication No.: US11983065B2Publication Date: 2024-05-14
- Inventor: Bruce A. Liikanen , Michael Sheperek
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Lowenstein Sandler LLP
- Main IPC: G06F11/10
- IPC: G06F11/10 ; G06F3/06

Abstract:
The present disclosure is directed to logic based read sample offset operations in a memory sub-system. A processing device performs a first read, a second read, and a third read of data from a memory devices using a first center value corresponding to a first read level threshold, a negative offset value, and a positive offset value, respectively. The processing device performs a XOR operation on results from the first and second reads to obtain a first value and a XOR operation on results from the second and third reads to obtain a second value. The processing device performs a first count operation on the first value to determine a first difference bit count and a second count operation on the second value to determine a second difference bit count. The processing device can store or output the first difference bit count and the second difference bit count.
Public/Granted literature
- US20210382786A1 LOGIC BASED READ SAMPLE OFFSET IN A MEMORY SUB-SYSTEM Public/Granted day:2021-12-09
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