A nonvolatile memory apparatus may include a memory cell, a bit line control circuit, and a word line control circuit. The memory cell may be coupled between a global bit line and a global word line. During a read operation, the bit line control circuit may provide a first high voltage to the global bit line and provide a second high voltage to the global bit line when snapback of the memory cell occurs. During the read operation, the word line control circuit may provide a second read supply voltage to the global word line and provide an anneal supply voltage to the global word line when snapback of the memory cell occurs.