Invention Grant
- Patent Title: Unbalanced failure detector circuit for detecting unbalanced failure of electronic device apparatus including electronic devices
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Application No.: US17627870Application Date: 2019-08-07
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Publication No.: US11984880B2Publication Date: 2024-05-14
- Inventor: Hironori Tauchi , Yuki Ito , Takashi Hyodo
- Applicant: OMRON Corporation
- Applicant Address: JP Kyoto
- Assignee: OMRON CORPORATION
- Current Assignee: OMRON CORPORATION
- Current Assignee Address: JP Kyoto
- Agency: CANTOR COLBURN LLP
- International Application: PCT/JP2019/031221 2019.08.07
- International Announcement: WO2021/024432A 2021.02.11
- Date entered country: 2022-01-18
- Main IPC: H03K17/082
- IPC: H03K17/082

Abstract:
An unbalanced failure detector circuit according to one aspect of the present disclosure is provided for detecting an unbalanced failure of an electronic device apparatus including electronic devices, and the electronic device apparatus includes a plurality of current paths connected in parallel. The unbalanced failure detector circuit includes a detector unit, and a controller. The detector unit has a plurality of coils connected in series and arranged to surround the plurality of current paths, respectively, and is configured to output a coil sum voltage which is a sum of induced voltages generated across the plurality of coils by currents flowing through the plurality of current paths. The controller is configured to detect the unbalanced failure of the electronic device apparatus when the coil sum voltage outputted from the detector unit exceeds a predetermined value range.
Public/Granted literature
Information query
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