Invention Grant
- Patent Title: Patch guide method and program
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Application No.: US17307179Application Date: 2021-05-04
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Publication No.: US11986319B2Publication Date: 2024-05-21
- Inventor: Dong Hyeon Kim , Jun Kil Been
- Applicant: NEUROPHET Inc.
- Applicant Address: KR Gwangju
- Assignee: NEUROPHET Inc.
- Current Assignee: NEUROPHET Inc.
- Current Assignee Address: KR Gwangju
- Agency: Studebaker & Brackett PC
- Priority: KR 20170108056 2017.08.25
- Main IPC: A61B5/00
- IPC: A61B5/00 ; A61B5/055 ; A61N1/04

Abstract:
The present disclosure relates to a patch guide method, including at least: acquiring a matched model of a 3D scan model and a 3D brain MM model; capturing an image of the head of the object by using a depth camera; matching one location of the captured image and one location on the matched model; and determining a patch location on the head of the object, by using a 3D brain map. In the method, physical characteristics of areas included in the brain MRI image are acquired and used to generate the 3D brain map of the object. In the method, a target stimulus point, to which an electrical stimulus is to be applied in a brain of the object, is acquired and used in a simulation of a delivery process of the electrical stimulus to the target stimulus point from candidate stimulus positions, to determine the patch location.
Public/Granted literature
- US20210267547A1 PATCH GUIDE METHOD AND PROGRAM Public/Granted day:2021-09-02
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