Invention Grant
- Patent Title: Membrane defect inspection method and membrane defect inspection device
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Application No.: US17296367Application Date: 2019-12-03
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Publication No.: US11986773B2Publication Date: 2024-05-21
- Inventor: Keishi Watanabe , Shintaro Nishimoto , Tetsuya Uenaka , Fang Zhao , Akira Matsunaga
- Applicant: KUBOTA CORPORATION
- Applicant Address: JP Osaka
- Assignee: KUBOTA CORPORATION
- Current Assignee: KUBOTA CORPORATION
- Current Assignee Address: JP Osaka
- Agency: Oliff PLC
- Priority: JP 18232095 2018.12.12
- International Application: PCT/JP2019/047119 2019.12.03
- International Announcement: WO2020/121880A 2020.06.18
- Date entered country: 2021-05-24
- Main IPC: B01D65/10
- IPC: B01D65/10 ; G01M3/24

Abstract:
A membrane defect inspection method that can detect damage in a filtrate membrane and can detect presence or absence of damage or a seal defect in a membrane module; and the method is for a membrane module set including multiple membrane modules connected under gas detection piping communicating with primary spaces of the multiple membrane modules where raw water is supplied or secondary spaces in multiple membrane modules where treated water is extracted after the raw water is filtrated by membranes. The method includes a gas injection process where gas is injected into spaces opposite the primary or secondary spaces communicating with gas detection piping in the multiple membrane modules while the gas detection piping is filled with water, and a vibration detection process where a vibration sensor is brought into contact with a protrusion protruding outward from the gas detection piping to detect vibration of the gas detection piping.
Public/Granted literature
- US20220023802A1 MEMBRANE DEFECT INSPECTION METHOD AND MEMBRANE DEFECT INSPECTION DEVICE Public/Granted day:2022-01-27
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