Invention Grant
- Patent Title: Deep learning of fault detection in onboard automobile systems
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Application No.: US17241481Application Date: 2021-04-27
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Publication No.: US11989983B2Publication Date: 2024-05-21
- Inventor: LuAn Tang , Haifeng Chen , Wei Cheng , Junghwan Rhee , Jumpei Kamimura
- Applicant: NEC Laboratories America, Inc.
- Applicant Address: US NJ Princeton
- Assignee: NEC Corporation
- Current Assignee: NEC Corporation
- Current Assignee Address: JP Tokyo
- Agent Joseph Kolodka
- Main IPC: G07C5/08
- IPC: G07C5/08 ; B60W50/02 ; B60W50/035 ; B60W50/038 ; G06N3/044 ; G06N3/045 ; G06N3/08 ; G06N3/088 ; G07C5/00

Abstract:
Methods and systems for vehicle fault detection include collecting operational data from sensors in a vehicle. The sensors are associated with vehicle sub-systems. The operational data is processed with a neural network to generate a fault score, which represents a similarity to fault state training scenarios, and an anomaly score, which represents a dissimilarity to normal state training scenarios. The fault score is determined to be above a fault score threshold and the anomaly score is determined to be above an anomaly score threshold to detect a fault. A corrective action is performed responsive the fault, based on a sub-system associated with the fault.
Public/Granted literature
- US20210350636A1 DEEP LEARNING OF FAULT DETECTION IN ONBOARD AUTOMOBILE SYSTEMS Public/Granted day:2021-11-11
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