Invention Grant
- Patent Title: Memory device and method for fabricating the same
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Application No.: US17984066Application Date: 2022-11-09
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Publication No.: US11991930B2Publication Date: 2024-05-21
- Inventor: Jung-Tang Wu , Szu-Ping Tung , Szu-Hua Wu , Shing-Chyang Pan , Meng-Yu Wu
- Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING CO, LTD.
- Applicant Address: TW Hsinchu
- Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO, LTD.
- Current Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO, LTD.
- Current Assignee Address: TW Hsinchu
- Agency: Maschoff Brennan
- The original application number of the division: US16059777 2018.08.09
- Main IPC: H01L43/12
- IPC: H01L43/12 ; H01L27/22 ; H01L43/02 ; H10B61/00 ; H10N50/01 ; H10N50/80

Abstract:
A structure includes a substrate, a transistor, a contact, an oxygen-free etch stop layer, an oxygen-containing etch stop layer, a dielectric layer, and a via. The transistor is on the substrate. The contact is on a source/drain region of the transistor. The oxygen-free etch stop layer spans the contact. The oxygen-containing etch stop layer extends along a top surface of the oxygen-free etch stop layer. The dielectric layer is over the oxygen-containing etch stop layer. The via passes through the dielectric layer, the oxygen-containing etch stop layer, and the oxygen-free etch stop layer and lands on the contact. The memory stack lands on the via.
Public/Granted literature
- US20230073308A1 MEMORY DEVICE AND METHOD FOR FABRICATING THE SAME Public/Granted day:2023-03-09
Information query
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