Invention Grant
- Patent Title: Systems and methods for measuring trace contaminants in gas matrix using integrated cavity output spectroscopy
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Application No.: US17849395Application Date: 2022-06-24
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Publication No.: US11994465B2Publication Date: 2024-05-28
- Inventor: François Tanguay , Kyle Owen , John Brian Leen , Axel Meunier , Bertrand Simon Lanher
- Applicant: ABB Schweiz AG
- Applicant Address: CH Baden
- Assignee: ABB Schweiz AG
- Current Assignee: ABB Schweiz AG
- Current Assignee Address: CH Baden
- Agency: Armstrong Teasdale LLP
- Main IPC: G01N21/39
- IPC: G01N21/39 ; G01N21/03

Abstract:
A laser absorption spectrometry system for gas measurement is provided. The system includes an integrated cavity output spectroscopy (ICOS) assembly. The assembly includes a gas cell including a cell body defining an optical cavity, one or more tunable diode lasers having one or more nominal wavelengths, and a reflective collimation mirror positioned in an optical path between the one or more tunable diode lasers and the gas cell.
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