Invention Grant
- Patent Title: Probe unit
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Application No.: US17294844Application Date: 2019-11-26
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Publication No.: US11994535B2Publication Date: 2024-05-28
- Inventor: Tsuyoshi Inuma , Shuji Takahashi
- Applicant: NHK Spring Co., Ltd.
- Applicant Address: JP Yokohama
- Assignee: NHK Spring Co., Ltd.
- Current Assignee: NHK Spring Co., Ltd.
- Current Assignee Address: JP Yokohama
- Agency: Locke Lord LLP
- Priority: JP 18221493 2018.11.27
- International Application: PCT/JP2019/046234 2019.11.26
- International Announcement: WO2020/111075A 2020.06.04
- Date entered country: 2021-05-18
- Main IPC: G01R1/04
- IPC: G01R1/04 ; G01R1/067 ; G01R1/073 ; G01R31/26 ; G01R31/28

Abstract:
A probe unit includes: a first contact probe configured to come in contact with a signal electrode; a second contact probe configured to come in contact with a ground electrode; a probe holder including a first holder hole through which the first contact probe passes, and a second holder hole through which the second contact probe passes; and a conductive floating member including a first through hole to which the first contact probe is inserted and the signal electrode is inserted, and a second through hole to which the second contact probe is inserted and the ground electrode is inserted. The probe holder is configured such that at least an inner circumferential surface of the first holder hole has an insulating property, and the probe unit has a coaxial structure in which central axes of the first contact probe and the first through hole are aligned with each other.
Public/Granted literature
- US20220018877A1 PROBE UNIT Public/Granted day:2022-01-20
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