Invention Grant
- Patent Title: Apparatus and method of analyzing developed impact marks, and computer program for executing the method
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Application No.: US17518570Application Date: 2021-11-03
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Publication No.: US11995887B2Publication Date: 2024-05-28
- Inventor: Nam Kyu Park , Byung Seon Moon , Jae Mo Goh , Jin Pyo Kim , Young Il Seo , Eun Ah Joo , Je Hyun Lee , Sang Yoon Lee
- Applicant: REPUBLIC OF KOREA (NATIONAL FORENSIC SERVICE DIRECTOR MINISTRY OF THE INTERIOR AND SAFETY)
- Applicant Address: KR Wonju-si
- Assignee: REPUBLIC OF KOREA (NATIONAL FORENSIC SERVICE DIRECTOR MINISTRY OF THE INTERIOR AND SAFETY)
- Current Assignee: REPUBLIC OF KOREA (NATIONAL FORENSIC SERVICE DIRECTOR MINISTRY OF THE INTERIOR AND SAFETY)
- Current Assignee Address: KR Wonju-si
- Agency: Hauptman Ham, LLP
- Priority: KR 20210110396 2021.08.20
- Main IPC: G06V10/44
- IPC: G06V10/44 ; G06F18/22 ; G06V20/00

Abstract:
A developed impact mark analysis apparatus includes: an image acquisition unit configured to obtain at least one first image by photographing impact marks that are developed, and to obtain a second image of impact marks at a crime scene that are developed from evidence at the crime scene; an outliner configured to outline the at least one first image to obtain at least one first outline image, and to outline the second image to obtain a second outline image; a database configured to store the first outline image corresponding to related tool characteristic information; a matching unit configured to search the database for the first outline image determined to be similar to the second outline image and match them with each other; a display unit; and a user input unit.
Public/Granted literature
- US20230060092A1 APPARATUS AND METHOD OF ANALYZING DEVELOPED IMPACT MARKS, AND COMPUTER PROGRAM FOR EXECUTING THE METHOD Public/Granted day:2023-02-23
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