Invention Grant
- Patent Title: Barrier structure for semiconductor device
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Application No.: US17871179Application Date: 2022-07-22
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Publication No.: US11996326B2Publication Date: 2024-05-28
- Inventor: Pin Chi Huang , Chien-Chang Fang , Rung Hung Hsueh
- Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
- Applicant Address: TW Hsinchu
- Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
- Current Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
- Current Assignee Address: TW Hsinchu
- Agency: Hauptman Ham, LLP
- The original application number of the division: US16554572 2019.08.28
- Main IPC: H01L21/768
- IPC: H01L21/768 ; H01L21/02 ; H01L29/66 ; H01L29/78

Abstract:
Methods for making semiconductor device having improve contact structures including the operations of depositing a first dielectric material, depositing a barrier material over the first dielectric material, depositing a second dielectric material over the barrier material, etching a two-slope contact opening with an upper sidewall angle of the opening through the second dielectric material that is less than a lower sidewall angle of the opening through the first dielectric material, and filling the two-slope contact opening with a conductive material, the conductive material.
Public/Granted literature
- US20220359278A1 BARRIER STRUCTURE FOR SEMICONDUCTOR DEVICE Public/Granted day:2022-11-10
Information query
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