Invention Grant
- Patent Title: Utensil for evaluating length measurement error in X-ray CT device for three-dimensional shape measurement
-
Application No.: US17678726Application Date: 2022-02-23
-
Publication No.: US11998382B2Publication Date: 2024-06-04
- Inventor: Taketo Kishi , Makoto Sato , Toshiyuki Takatsuji , Makoto Abe , Hiroyuki Fujimoto
- Applicant: Shimadzu Corporation , NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY
- Applicant Address: JP Kyoto
- Assignee: Shimadzu Corporation,NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY
- Current Assignee: Shimadzu Corporation,NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY
- Current Assignee Address: JP Kyoto; JP Tokyo
- Agency: Maier & Maier, PLLC
- Priority: JP 17084774 2017.04.21
- Main IPC: A61B6/58
- IPC: A61B6/58 ; A61B6/03 ; A61B90/00

Abstract:
In order to sufficiently capture spatial distortion specific to an X-ray CT device and evaluate the three-dimensional shape measurement accuracy of the X-ray CT device, in a utensil, by attaching support rods fixing spheres to the tip thereof and having different lengths to a base spheres are arranged in an XYZ space on the base. On a flat surface on the top of the base, the support rods supporting the spheres and having different lengths are arranged at predetermined intervals. In doing so, the spheres are arranged in the XYZ space respectively at appropriate inter-sphere distances.
Public/Granted literature
Information query