Invention Grant
- Patent Title: Shear wave elasticity measurement method and shear wave elasticity imaging system
-
Application No.: US17097881Application Date: 2020-11-13
-
Publication No.: US11998392B2Publication Date: 2024-06-04
- Inventor: Shuangshuang Li
- Applicant: SHENZHEN MINDRAY BIO-MEDICAL ELECTRONICS CO., LTD. , SHENZHEN MINDRAY SCIENTIFIC CO., LTD.
- Applicant Address: CN Guangdong
- Assignee: Shenzhen Mindray Bio-Medical Electronics Co., Ltd.,Shenzhen Mindray Scientific Co., Ltd.
- Current Assignee: Shenzhen Mindray Bio-Medical Electronics Co., Ltd.,Shenzhen Mindray Scientific Co., Ltd.
- Current Assignee Address: CN Shenzhen; CN Shenzhen
- Agency: Sheppard Mullin Richter & Hampton LLP
- Main IPC: A61B8/08
- IPC: A61B8/08 ; A61B8/00 ; G01N29/04

Abstract:
A shear wave elasticity measurement method and a shear wave elasticity imaging system are disclosed. For each pair of corresponding shear waves, an echo signal within a continuous period of time can be obtained only at a third position, so that an elasticity parameter corresponding to the target area can be obtained according to the echo signal within the continuous period of time. Not only the position required for obtaining an echo signal is few, but also the total data volume required for obtaining the echo signal is few. The calculation method is also easy, which significantly reduces the system performance requirement.
Public/Granted literature
- US20210077072A1 SHEAR WAVE ELASTICITY MEASUREMENT METHOD AND SHEAR WAVE ELASTICITY IMAGING SYSTEM Public/Granted day:2021-03-18
Information query