Invention Grant
- Patent Title: Method and system for line-by-line one dimensional fabric inspection
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Application No.: US17272317Application Date: 2019-08-21
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Publication No.: US12000070B2Publication Date: 2024-06-04
- Inventor: Shmuel Cohen
- Applicant: USTER TECHNOLOGIES LTD.
- Applicant Address: IL Caesarea
- Assignee: USTER TECHNOLOGIES LTD.
- Current Assignee: USTER TECHNOLOGIES LTD.
- Current Assignee Address: IL Caesarea
- Agency: AlphaPatent Associates Ltd.
- Agent Daniel J. Swirsky
- International Application: PCT/IB2019/057031 2019.08.21
- International Announcement: WO2020/044172A 2020.03.05
- Date entered country: 2021-02-28
- Main IPC: G06T7/90
- IPC: G06T7/90 ; D03J1/00 ; G01N21/88 ; G06T7/00 ; H04N23/60 ; G01N21/84

Abstract:
System and method for on-loom fabric inspection includes an imaging device collecting images of a weaving area of a loom, a frame grabber receiving images of a fell-pick of and sending compact image data packages to an image processor. Irregularities may be detected by comparing a digital string representing the characteristic sequence of warp-risers and warp-sinkers along the fell-pick with a corresponding row (901) of required warp-risers and required warp-sinkers in a reference matrix (900) representing a required weaving pattern. The digital string may be a sequence of Boolean values.
Public/Granted literature
- US20210238781A1 METHOD AND SYSTEM FOR LINE-BY-LINE ONE DIMENSIONAL FABRIC INSPECTION Public/Granted day:2021-08-05
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